Subsurface metrology using scanning white light interferometry: absolute z coordinates deep inside displays
Mobile devices with interactive displays are ubiquitous commodities. Efficient quality control (QC) drives competitiveness. Scanning white light interferometry imaging offers a fast and nondestructive tool for QC purposes. Relying on optical compensation and image stitching, one can rapidly and ...
Source: Journal of the Optical Society of America A - Category: Physics Authors: Anton Nolvi Ivan Kassamakov Edward H æ ggstr ö m Source Type: research