Baseline Drift Detrending Techniques for Fast Scan Cyclic Voltammetry

Analyst, 2017, Accepted Manuscript DOI: 10.1039/C7AN01465A, PaperMark DeWaele, Yoonbae Oh, Cheonho Park, Yu Min Kang, Hojin Shin, Charles Blaha, Kevin E. Bennet, In Young Kim, Kendall H. Lee, Dong Pyo Jang Fast scan cyclic voltammetry (FSCV) has been commonly used to measure extracellular neurotransmitter concentrations in the brain. Due to the unstable nature of the background currents inherent in FSCV measurements,... The content of this RSS Feed (c) The Royal Society of Chemistry
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