Axicon-based Bessel beams for flat-field illumination in total internal reflection fluorescence microscopy

Total internal reflection fluorescence microscopy (TIRF-M) provides low-invasive high-contrast surface imaging with optical sectioning of typically 100 – 200   nm. Thus, TIRF-M has become an established tool for imaging surfaces, including cell membranes. For TIRF-M, a homogenous ...

Source: Optics Letters - September 22, 2017 Category: Physics Authors: Benjamin Schreiber Kareem Elsayad Katrin G. Heinze Source Type: research