Reflectance calculations of anisotropic dielectric constants of graphene-like two-dimensional materials

A new optical method for determining anisotropic dielectric constants of graphene-like two-dimensional materials on semiconductor or metal substrates is developed. The method is based on the surface differential reflectance measurements at three different incident angles. The inversion problem is ...

Source: Applied Optics - September 22, 2017 Category: Physics Authors: Peep Adamson Source Type: research