Temperature-dependent thermal properties of Ru/C multilayers

Multilayers made of Ru/C are the most promising candidates when working in the energy region 8 – 20   keV. The stability of its thermal properties, including thermal expansion and thermal conduction, needs to be considered for monochromator or focusing components. Ru/C multilayers with periodic thicknesses of 3, 4 and 5   nm were investigated in   situ by grazing-incidence X-ray reflectometry and diffuse scattering in order to study their thermal expansion characteristics as a function of annealing temperature up to 400 ° C. The thermal conductivity of multilayers with the same structure was also measured by the transient hot-wire method and compared with bulk values.

Source: Journal of Synchrotron Radiation - July 28, 2017 Category: Physics Authors: Yan S. Jiang, H. Wang, H. He, Y. Li, A. Zheng, Y. Dong, Z. Tian, N. Tags: multilayer X-ray interface thermal conductivity research papers Source Type: research