Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated.

Source: Journal of Synchrotron Radiation - August 10, 2016 Category: Physics Authors: Jones, M.W.M. Phillips, N.W. Riessen, G.A. van Abbey, B. Vine, D.J. Nashed, Y.S.G. Mudie, S.T. Afshar, N. Kirkham, R. Chen, B. Balaur, E. de Jonge, M.D. Tags: X-ray fluorescence scanning X-ray diffraction microscopy ptychography research papers Source Type: research